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URN: urn:nbn:de:swb:90-20242

A generalized approach for measuring the dielectric properties of lossy composite materials

Akhtar, M. J.; Feher, L.; Thumm, Manfred

Abstract:
A generalized technique is presented to measure the dielectric properties of lossy composite materials. The overall method is based on measuring the spectral domain reflection and transmission coefficients of the material-under-test (MUT) using a Vector Network Analyzer (VNA), and then finding the dielectric properties of MUT from the measured scattering data using a proposed reconstruction algorithm. The effect of noise on the reconstruction is examined, and it is observed that even with 5% relative error in the scattering data, the proposed algorithm produces a stable inversion.


Zugehörige Institution(en) am KIT Institut für Höchstfrequenztechnik und Elektronik (IHE)
Institut für Hochleistungsimpuls- und Mikrowellentechnik (IHM)
Publikationstyp Proceedingsbeitrag
Jahr 2005
Sprache Englisch
Identifikator ISBN: 0-8169-0967-9
URN: urn:nbn:de:swb:90-20242
KITopen ID: 1000002024
HGF-Programm 11.11.02; LK 01
Erschienen in 4th World Congress on Microwave and RF Applications, Austin, USA, November 7-12, 2004
Verlag AIChE, New York
Seiten 146-147
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