KIT | KIT-Bibliothek | Impressum | Datenschutz

Methods for run-time failure recognition and recovery in dynamic and partial reconfigurable systems based on Xilinx Virtex-II Pro FPGAs

Paulsson, K.; Huebner, M.; Jung, M.; Becker, J.

The rapid development of hardware/software and microelectronic technology enables the realization of more complex systems with new characteristics. These characteristics could lead to further advances in electronic measurement-, control- and regulation systems. The industrial demands of future electronic systems rely on systems to be fault-tolerant, since the complexity increased to the point where it is impossible to detect all errors during the design phase. The ability for a system to recover from a failure requires that incorrect system operation can be detected and analysed during run-time. To achieve this, methods for performing tests of functionalities and components dynamically must be incorporated in the system behaviour during the design phase. This paper presents methods for efficient on-line failure detection, integrated in a reconfigurable system for execution and test of multiple automotive inner cabin functions. These methods also allow a certain degree of failure recovery, and even make it possible for a system to heal itself from more advanced faults. By exploiting the ability of dynamic and partial hardware reconfi ... mehr

Seitenaufrufe: 37
seit 06.05.2018
Zugehörige Institution(en) am KIT Institut für Technik der Informationsverarbeitung (ITIV)
Publikationstyp Proceedingsbeitrag
Jahr 2006
Sprache Englisch
Identifikator ISBN: 978-0-7695-2533-4
KITopen-ID: 1000014292
Erschienen in IEEE Computer Society Annual Symposium on Emerging VLSI Technologies and Architectures, 2 - 3 March 2006, Karlsruhe, Germany. Ed.: J. Becker
Verlag IEEE Computer Society, Los Alamitos (Calif.)
Seiten 6 S.
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft
KITopen Landing Page