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Nonintrusive Black- and White-Box Testing of Embedded Systems Software against UML Models

Graf, P.; Mueller-Glaser, K. D.; Reichmann, C.

Abstract:
We extend a model based development approach for software components of embedded systems by a model based testing framework. We motivate by describing challenges a developer has to face when developing embedded software and present as a solution an UML-centric development approach. We introduce a testing framework that allows specification of test cases for UML class models using UML sequence- and use-case-diagrams. These test cases define participating objects and their messages including parameters, loops, control structures, inclusion of other collaborations and time constraints. These diagrams are verified against the real system-response of the software under test. We employ a commercial in-circuit emulator to record method calls, object identities and their parameters on C source-code level as messages with minimal impact on system performance and map these back to model level to verify them against the specified model.



Seitenaufrufe: 21
seit 22.05.2018
Zugehörige Institution(en) am KIT Institut für Technik der Informationsverarbeitung (ITIV)
Publikationstyp Proceedingsbeitrag
Jahr 2007
Sprache Englisch
Identifikator ISBN: 978-0-7695-2834-2
KITopen-ID: 1000014315
Erschienen in RSP 2007 - 18th IEEE/IFIP International Workshop on Rapid System Prototyping, 28 - 30 May 2007, Porto Alegre, RS, Brazil
Verlag IEEE, Piscataway (NJ)
Seiten 130 - 138
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