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Nonintrusive Black- and White-Box Testing of Embedded Systems Software against UML Models

Graf, P.; Mueller-Glaser, K. D.; Reichmann, C.

Abstract:
We extend a model based development approach for software components of embedded systems by a model based testing framework. We motivate by describing challenges a developer has to face when developing embedded software and present as a solution an UML-centric development approach. We introduce a testing framework that allows specification of test cases for UML class models using UML sequence- and use-case-diagrams. These test cases define participating objects and their messages including parameters, loops, control structures, inclusion of other collaborations and time constraints. These diagrams are verified against the real system-response of the software under test. We employ a commercial in-circuit emulator to record method calls, object identities and their parameters on C source-code level as messages with minimal impact on system performance and map these back to model level to verify them against the specified model.


Zugehörige Institution(en) am KIT Institut für Technik der Informationsverarbeitung (ITIV)
Publikationstyp Proceedingsbeitrag
Jahr 2007
Sprache Englisch
Identifikator ISBN: 978-0-7695-2834-2
KITopen-ID: 1000014315
Erschienen in RSP 2007 - 18th IEEE/IFIP International Workshop on Rapid System Prototyping, 28 - 30 May 2007, Porto Alegre, RS, Brazil
Verlag IEEE, Piscataway (NJ)
Seiten 130 - 138
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