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Depth First Traversal Algorithm for Efficient Build-in Self-Test in Nano Fabrics

Niknahad, M.; Becker, J.

We describe an algorithmic method comes from Depth First Traversal algorithm for covering the nanoblocks in an easier and more efficient way in using BIST test method in Nano Fabrics. This method easily makes the high dense Nano Fabric acts as a Tree and then uses DFT to assign each nanoblock TPGs, BUTs and ORAs(the fundamental parts of BIST test method). The complexity of this algorithm when n is the number of nanoblocks is O(nlog(n)) and this quick order of running is very important because of the high dense nature of Nano Fabrics.

Zugehörige Institution(en) am KIT Institut für Technik der Informationsverarbeitung (ITIV)
Publikationstyp Proceedingsbeitrag
Publikationsjahr 2008
Sprache Englisch
Identifikator ISBN: 978-84-691-3603-4
KITopen-ID: 1000014365
Erschienen in Workshop Proceedings / 4th International Workshop on Reconfigurable, Communication Centric System-on-Chips (ReCoSoC), July 9-11, 2008, Barcelona, Spain
Verlag Barcelona
Seiten 4
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