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Cross-Layer Approaches for an Aging-Aware Design of Nanoscale Microprocessors

Oboril, Fabian

Thanks to aggressive scaling of transistor dimensions, computers have revolutionized our life. However, the increasing unreliability of devices fabricated in nanoscale technologies emerged as a major threat for the future success of computers. In particular, accelerated transistor aging is of great importance, as it reduces the lifetime of digital systems. This thesis addresses this challenge by proposing new methods to model, analyze and mitigate aging at microarchitecture-level and above.

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Volltext §
DOI: 10.5445/IR/1000045647
Zugehörige Institution(en) am KIT Institut für Technische Informatik (ITEC)
Publikationstyp Hochschulschrift
Jahr 2015
Sprache Englisch
Identifikator urn:nbn:de:swb:90-456471
KITopen-ID: 1000045647
Verlag KIT, Karlsruhe
Abschlussart Dissertation
Fakultät Fakultät für Informatik (INFORMATIK)
Institut Institut für Technische Informatik (ITEC)
Prüfungsdaten 29.01.2015
Referent/Betreuer Prof. M. B. Tahoori
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft
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