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URN: urn:nbn:de:swb:90-484801

Soft Error Analysis and Mitigation at High Abstraction Levels

Chen, Liang

Radiation-induced soft errors, as one of the major reliability challenges in future technology nodes, have to be carefully taken into consideration in the design space exploration. This thesis presents several novel and efficient techniques for soft error evaluation and mitigation at high abstract levels, i.e. from register transfer level up to behavioral algorithmic level. The effectiveness of proposed techniques is demonstrated with extensive synthesis experiments.

Zugehörige Institution(en) am KIT Institut für Technische Informatik (ITEC)
Publikationstyp Hochschulschrift
Jahr 2015
Sprache Englisch
Identifikator KITopen ID: 1000048480
Verlag Karlsruhe
Abschlussart Dissertation
Fakultät Fakultät für Informatik (INFORMATIK)
Institut Institut für Technische Informatik (ITEC)
Prüfungsdaten 19.06.2015
Referent/Betreuer Prof. M. B. Tahoori
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