Techniques for Aging, Soft Errors and Temperature to Increase the Reliability of Embedded On-Chip Systems
Abstract:
This thesis investigates the challenge of providing an abstracted, yet sufficiently accurate reliability estimation for embedded on-chip systems. In addition, it also proposes new techniques to increase the reliability of register files within processors against aging effects and soft errors. It also introduces a novel thermal measurement setup that perspicuously captures the infrared images of modern multi-core processors.
| Zugehörige Institution(en) am KIT | Institut für Technische Informatik (ITEC) |
| Publikationstyp | Hochschulschrift |
| Publikationsjahr | 2015 |
| Sprache | Englisch |
| Identifikator | urn:nbn:de:swb:90-496592 KITopen-ID: 1000049659 |
| Verlag | Karlsruher Institut für Technologie (KIT) |
| Art der Arbeit | Dissertation |
| Fakultät | Fakultät für Informatik (INFORMATIK) |
| Institut | Institut für Technische Informatik (ITEC) |
| Prüfungsdaten | 03.06.2015 |
| Schlagwörter | Reliability, Aging, Soft Error, Temperature |
| Referent/Betreuer | Henkel, J. |