KIT | KIT-Bibliothek | Impressum | Datenschutz

Ion beam deposition and structural characterization of GMR spin valves

Wang, S. X. 1; Bailey, W. E.; Sürgers, Christoph
1 Universität Karlsruhe (TH)

NiO exchange-biased ''bottom'' spin valves of the type NiO/NiFe/Co/Cu/Co/NiFe and FeMn exchange-biased ''top'' spin valves of the type NiFe/Co/Cu/Co/NiFe/FeMn were deposited by ion-beam deposition (except the NiO layer). Their magnetic properties, magneto-transport, and microstructures are characterized and compared with corresponding GMR spin valves deposited by de magnetron sputtering, High-resolution cross-sectional transmission electron microscopy and X-ray diffraction reveal microstructural differences between ion-beam-deposited and de magnetron sputtered spin valves. In particular, film texture, surface morphology, GMR ratio, exchange bias, interlayer coupling strength, and coercivity vary widely, but property-structure-processing correlation can be identified, A GMR ratio of similar to 9.7% was obtained on random textured NiO exchange-biased bottom spin valves by ion-beam deposition.

DOI: 10.1109/20.573860
Zitationen: 21
Zitationen: 20
Zugehörige Institution(en) am KIT Physikalisches Institut (PHI)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 1997
Sprache Englisch
Identifikator ISSN: 0018-9464
KITopen-ID: 1000050478
Erschienen in IEEE Transactions on Magnetics
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Band 33
Heft 3
Seiten 2369 -2374
Nachgewiesen in Web of Science
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft
KITopen Landing Page