KIT | KIT-Bibliothek | Impressum

Interface orientation distribution during grain growth in bulk SrTiO 3 measured by means of 3D X-ray diffraction contrast tomography

Syha, M.; Rheinheimer, W.; Bäurer, M.; Lauridsen, E.M.; Ludwig, W.; Weygand, D.; Gumbsch, P.

Abstract: 3D x-ray diffraction contrast tomography (DCT) is a non-destructive technique for the determination of grain shape and crystallography in polycrystalline bulk materials. Using this technique, a strontium titanate specimen was repeatedly measured between annealing steps.. A systematic analysis of the growth history of selected grains before and after the ex-situ annealing step allows to extract the topological and morphological changes during grain growth. Furthermore, misorientation as well as interface orientation information of the microstructure reconstructions have been determined. The interface normal distribution clearly shows a preference for (100) oriented interfaces in the selected grains when annealed at 1600°C. This observation can be connected to existent interfacial energy estimations resulting from capillarity vector reconstructions.


Zugehörige Institution(en) am KIT Institut für Angewandte Materialien - Keramische Werkstoffe und Technologien (IAM-KWT)
Publikationstyp Proceedingsbeitrag
Jahr 2012
Sprache Englisch
Identifikator DOI: 10.1557/opl.2012.831
ISBN: 978-1-62748-232-5
ISSN: 0272-9172
KITopen ID: 1000051669
Erschienen in Three-dimensional tomography of materials : November 28 - December 3, 2011, Boston, Massachusetts, USA ; [Symposium PP, Three-Dimensional Tomography of Materials ; held at 2011 MRS fall meeting]. Ed.: C. Larabell
Verlag Cambridge Univ. Pr., New York (NY)
Seiten 58-62
Serie Materials Research Society symposium proceedings ; 1421
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft KITopen Landing Page