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URN: urn:nbn:de:swb:90-526776
DOI: 10.1016/j.apsusc.2015.10.223
Zitationen: 3
Web of Science
Zitationen: 3

Solid-material-based Coupling Efficiency Analyzed with Time-of-Flight Secondary Ion Mass Spectrometry

Muenster, Bastian; Welle, Alexander; Ridder, Barbara; Althuon, Daniela; Striffler, Jakob; Foertsch, Tobias C.; Hahn, Lothar; Thelen, Richard; Stadler, Volker; Nesterov-Mueller, Alexander; Breitling, Frank; Loeffler, Felix F.

Abstract (englisch):
The coupling behavior of a microparticle embedded amino acid active-ester into a Poly(ethylene glycol)methacrylate-film, synthesized onto a silicon wafer by a grafting from approach, is characterized using dynamic time-of-flight secondary ion mass spectrometry (ToF-SIMS) to analyze the 3d distribution of the amino acids in the polymer film. Besides standard solid phase peptide synthesis, employing solubilized amino acids in a solvent, we used solid polymer microparticles, incorporating the amino acids. These microparticles were especially designed for a new technique to produce high-density combinatorial peptide microarrays: upon heating, the particles become viscous, which releases the embedded amino acids to diffuse and couple to the surface. In the scope of the development of this new particle-based application, ToF-SIMS is used to analyze a complex chemically modified polymer surface layer. Due to depth profile measurements, it is possible to investigate the particle-based coupling reaction not only on the surface, but also into the depth of the PEGMA film.

Zugehörige Institution(en) am KIT Institut für Funktionelle Grenzflächen (IFG)
Institut für Mikrostrukturtechnik (IMT)
Karlsruhe Nano Micro Facility (KNMF)
Publikationstyp Zeitschriftenaufsatz
Jahr 2016
Sprache Englisch
Identifikator ISSN: 0169-4332, 1873-5584

KITopen-ID: 1000052677
HGF-Programm 47.01.03 (POF III, LK 01)
Erschienen in Applied surface science
Band 360
Seiten 306–314
Nachgewiesen in Web of Science
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