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New Concepts For Controlled Homoepitaxy

Rosenfeld, G.; Lipkin, N. N.; Wulfhekel, W.; Kliewer, J.; Morgenstern, K.; Poelsema, B.; Comsa, G.


On the basis of a kinetic growth model we discuss new methods to grow atomically flat homoepitaxial layers in a controlled way. The underlying principle of these methods is to change the growth parameters during growth of an atomic layer in such a way that nucleation on top of a growing layer is suppressed, and thus, layer-by-layer growth is achieved. Experimentally, this can be realized by changing the substrate temperature or deposition rate during monolayer growth in a well-defined way. The same can be achieved at constant temperature and deposition rate by simultaneous ion bombardment during the early stages of growth of a monolayer, or by adding suitable surfactants to the system. Model experiments on Ag(lll) and on Cu(lll) using thermal energy atom scattering and scanning tunneling microscopy demonstrate the success of these methods.

DOI: 10.1007/BF01540247
Zitationen: 80
Zitationen: 78
Zugehörige Institution(en) am KIT Physikalisches Institut (PHI)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 1995
Sprache Englisch
Identifikator ISSN: 0947-8396
KITopen-ID: 1000053849
Erschienen in Applied Physics A: Materials Science and Processing
Verlag Springer
Band 61
Heft 5
Seiten 455-466
Nachgewiesen in Dimensions
Web of Science
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