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Spin-polarized scanning tunneling microscope for imaging the in-plane magnetization

Schlickum, U.; Wulfhekel, W.; Kirschner, J.

Abstract:
We present a spin-polarized scanning tunneling microscope (Sp-STM) for imaging the magnetic in-plane component of magnetic surfaces. Magnetic in-plane sensitivity is obtained by using a ferromagnetic ring as a Sp-STM tip. By periodically switching the magnetization of the ring, the spin-dependent tunneling current between the ring and a spin-polarized sample is measured. The topography and the spin polarization can be imaged at the same time. We resolved the 180degrees domain wall of Fe whiskers and antiferromagnetic coupled Mn layers on Fe(001). (C) 2003 American Institute of Physics.


Zugehörige Institution(en) am KIT Physikalisches Institut (PHI)
Publikationstyp Zeitschriftenaufsatz
Jahr 2003
Sprache Englisch
Identifikator DOI: 10.1063/1.1606867
ISSN: 0003-6951
KITopen ID: 1000053851
Erschienen in Applied Physics Letters
Band 83
Heft 10
Seiten 2016-2018
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