We present a spin-polarized scanning tunneling microscope (Sp-STM) for imaging the magnetic in-plane component of magnetic surfaces. Magnetic in-plane sensitivity is obtained by using a ferromagnetic ring as a Sp-STM tip. By periodically switching the magnetization of the ring, the spin-dependent tunneling current between the ring and a spin-polarized sample is measured. The topography and the spin polarization can be imaged at the same time. We resolved the 180degrees domain wall of Fe whiskers and antiferromagnetic coupled Mn layers on Fe(001). (C) 2003 American Institute of Physics.