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Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry

Koch, Frieder J. 1; Detlefs, Carsten; Schröter, Tobias J. 1; Kunka, Danays 1; Last, Arndt 1; Mohr, Jürgen 1
1 Institut für Mikrostrukturtechnik (IMT), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Refractive X-ray lenses are in use at a large number of synchrotron experiments. Several materials and fabrication techniques are available for their production, each having their own strengths and drawbacks. We present a grating interferometer for the quantitative analysis of single refractive X-ray lenses and employ it for the study of a beryllium point focus lens and a polymer line focus lens, highlighting the differences in the outcome of the fabrication methods. The residuals of a line fit to the phase gradient are used to quantify local lens defects, while shape aberrations are quantified by the decomposition of the retrieved wavefront phase profile into either Zernike or Legendre polynomials, depending on the focus and aperture shape. While the polymer lens shows better material homogeneity, the beryllium lens shows higher shape accuracy.


Volltext §
DOI: 10.5445/IR/1000054672
Originalveröffentlichung
DOI: 10.1364/OE.24.009168
Scopus
Zitationen: 13
Web of Science
Zitationen: 13
Dimensions
Zitationen: 15
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Mikrostrukturtechnik (IMT)
Universität Karlsruhe (TH) – Interfakultative Einrichtungen (Interfakultative Einrichtungen)
Karlsruhe School of Optics & Photonics (KSOP)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2016
Sprache Englisch
Identifikator ISSN: 1094-4087
urn:nbn:de:swb:90-546728
KITopen-ID: 1000054672
HGF-Programm 43.23.02 (POF III, LK 01) X-Ray Optics
Erschienen in Optics express
Verlag Optica Publishing Group (OSA)
Band 24
Heft 9
Seiten 9168-9177
Bemerkung zur Veröffentlichung Gefördert durch den KIT-Publikationsfonds
Nachgewiesen in Web of Science
Scopus
Dimensions
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