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Quantitative characterization of X-ray lenses from two fabrication techniques with grating interferometry

Koch, Frieder J.; Detlefs, Carsten; Schröter, Tobias J.; Kunka, Danays; Last, Arndt; Mohr, Jürgen

Abstract (englisch): Refractive X-ray lenses are in use at a large number of synchrotron experiments. Several materials and fabrication techniques are available for their production, each having their own strengths and drawbacks. We present a grating interferometer for the quantitative analysis of single refractive X-ray lenses and employ it for the study of a beryllium point focus lens and a polymer line focus lens, highlighting the differences in the outcome of the fabrication methods. The residuals of a line fit to the phase gradient are used to quantify local lens defects, while shape aberrations are quantified by the decomposition of the retrieved wavefront phase profile into either Zernike or Legendre polynomials, depending on the focus and aperture shape. While the polymer lens shows better material homogeneity, the beryllium lens shows higher shape accuracy.

Zugehörige Institution(en) am KIT Institut für Mikrostrukturtechnik (IMT)
Publikationstyp Zeitschriftenaufsatz
Jahr 2016
Sprache Englisch
Identifikator DOI: 10.1364/OE.24.009168
ISSN: 1094-4087
URN: urn:nbn:de:swb:90-546728
KITopen ID: 1000054672
HGF-Programm 43.14.02; LK 01
Erschienen in Optics express
Band 24
Heft 9
Seiten 9168-9177
Bemerkung zur Veröffentlichung Gefördert durch den KIT-Publikationsfonds
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