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On Detecting Concurrency Defects Automatically at the Design Level

Padberg, Frank; Carril Rodriguez, Luis Manuel; Blersch, Martin; Denninger, Oliver


We describe an automated approach for detecting concurrency defects from design diagrams of a software, in particular, sequence diagrams. From a given sequence diagram, we automatically infer a formal, parallel specification that generalizes the communication behavior that is designed informally and incompletely in the diagram. We model-check the parallel specification against generic concurrency defect patterns. No additional specification of the software is needed. We present several case-studies to evaluate our approach. The results show that our approach is technically feasible, and effective in detecting nasty concurrency defects at the design level.

Volltext §
DOI: 10.5445/IR/1000055667
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Programmstrukturen und Datenorganisation (IPD)
Publikationstyp Proceedingsbeitrag
Publikationsjahr 2013
Sprache Englisch
Identifikator ISBN: 978-1-4799-2145-4
KITopen-ID: 1000055667
Erschienen in 20th Asia-Pacific Software Engineering Conference (APSEC 2013), Bangkok, Thailand, 2 - 5 December 2013 ; [proceedings]
Verlag Institute of Electrical and Electronics Engineers (IEEE)
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