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On Detecting Concurrency Defects Automatically at the Design Level

Padberg, Frank; Carril Rodriguez, Luis Manuel; Blersch, Martin; Denninger, Oliver

Abstract: We describe an automated approach for detecting concurrency defects from design diagrams of a software, in particular, sequence diagrams. From a given sequence diagram, we automatically infer a formal, parallel specification that generalizes the communication behavior that is designed informally and incompletely in the diagram. We model-check the parallel specification against generic concurrency defect patterns. No additional specification of the software is needed. We present several case-studies to evaluate our approach. The results show that our approach is technically feasible, and effective in detecting nasty concurrency defects at the design level.


Zugehörige Institution(en) am KIT Institut für Programmstrukturen und Datenorganisation (IPD)
Publikationstyp Proceedingsbeitrag
Jahr 2013
Sprache Englisch
Identifikator ISBN: 978-1-4799-2145-4
KITopen ID: 1000055667
Erschienen in 20th Asia-Pacific Software Engineering Conference (APSEC 2013), Bangkok, Thailand, 2 - 5 December 2013 ; [proceedings]
Verlag IEEE
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