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Comparison of small baseline interferometric SAR processors for estimating ground deformation

Gong, Wenyu; Thiele, Antje; Hinz, Stefan; Meyer, Franz J.; Hooper, Andrew; Agram, Piyush S.

Abstract:
The small Baseline Synthetic Aperture Radar (SAR) Interferometry (SBI) technique has been widely and successfully applied in various ground deformation monitoring applications. Over the last decade, a variety of SBI algorithms have been developed based on the same fundamental concepts. Recently developed SBI toolboxes provide an open environment for researchers to apply different SBI methods for various purposes. However, there has been no thorough discussion that compares the particular characteristics of different SBI methods and their corresponding performance in ground deformation reconstruction. Thus, two SBI toolboxes that implement a total of four SBI algorithms were selected for comparison. This study discusses and summarizes the main differences, pros and cons of these four SBI implementations, which could help users to choose a suitable SBI method for their specific application. The study focuses on exploring the suitability of each SBI module under various data set conditions, including small/large number of interferograms, the presence or absence of larger time gaps, urban/vegetation ground coverage, and temporally regular/irregular ground displacement with multiple spatial scales. ... mehr

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Volltext §
DOI: 10.5445/IR/1000056285
Originalveröffentlichung
DOI: 10.3390/rs8040330
Scopus
Zitationen: 13
Web of Science
Zitationen: 11
Cover der Publikation
Zugehörige Institution(en) am KIT Fakultät für Bauingenieur-, Geo- und Umweltwissenschaften (BGU)
Institut für Photogrammetrie und Fernerkundung (IPF)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2016
Sprache Englisch
Identifikator ISSN: 2072-4292
urn:nbn:de:swb:90-562857
KITopen-ID: 1000056285
HGF-Programm 12.03 (POF III, LK 01) Tropospheric trace substances
Erschienen in Remote sensing
Verlag MDPI
Band 8
Heft 4
Seiten Art. Nr. 330
Nachgewiesen in Web of Science
Scopus
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