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Multiscale dispersion-state characterization of nanocomposites using optical coherence tomography

Schneider, Simon; Eppler, Florian; Weber, Marco; Olowojoba, Ganiu; Weiss, Patrick; Hübner, Christof; Mikonsaari, Irma; Freude, Wolfgang; Koos, Christian

Abstract (englisch): Nanocomposite materials represent a success story of nanotechnology. However, development of nanomaterial fabrication still suffers from the lack of adequate analysis tools. In particular, achieving and maintaining well-dispersed particle distributions is a key challenge, both in material development and industrial production. Conventional methods like optical or electron microscopy need laborious, costly sample preparation and do not permit fast extraction of nanoscale structural information from statistically relevant sample volumes. Here we show that optical coherence tomography (OCT) represents a versatile tool for nanomaterial characterization, both in a laboratory and in a production environment. The technique does not require sample preparation and is applicable to a wide range of solid and liquid material systems. Large particle agglomerates can be directly found by OCT imaging, whereas dispersed nanoparticles are detected by model-based analysis of depth-dependent backscattering. Using a model system of polystyrene nanoparticles, we demonstrate nanoparticle sizing with high accuracy. We further prove the viability of the approach by characterizing highly relevant material systems based on nanoclays or carbon nanotubes. The technique is perfectly suited for in-line metrology in a production environment, which is demonstrated using a state-of-the-art compounding extruder. These experiments represent the first demonstration of multiscale nanomaterial characterization using OCT.

Zugehörige Institution(en) am KIT Institut für Produktentwicklung (IPEK)
Institut für Mikrostrukturtechnik (IMT)
Institut für Photonik und Quantenelektronik (IPQ)
Publikationstyp Zeitschriftenaufsatz
Jahr 2016
Sprache Englisch
Identifikator DOI: 10.1038/srep31733
ISSN: 2045-2322
URN: urn:nbn:de:swb:90-599918
KITopen ID: 1000059991
HGF-Programm 43.23.03; LK 01
Erschienen in Scientific reports
Band 6
Seiten Art.Nr.:31733
Bemerkung zur Veröffentlichung Gefördert durch den KIT-Publikationsfonds
Schlagworte Imaging and sensing; Nanoparticles; Optical metrology
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