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Determination of the packing fraction in photonic glass using synchrotron radiation nanotomography

Ogurreck, Malte; Rosario, Jefferson J. do; Leib, Elisabeth W.; Laipple, Daniel; Greving, Imke; Marschall, Felix 1; Last, Arndt 1; Schneider, Gerold A.; Vossmeyer, Tobias; Weller, Horst 1; Beckmann, Felix; Müller, Martin
1 Institut für Mikrostrukturtechnik (IMT), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Photonic glass is a material class that can be used as photonic broadband reflectors, for example in the infrared regime as thermal barrier coating films. Photonic properties such as the reflectivity depend on the ordering and material packing fraction over the complete film thickness of up to 100 µm. Nanotomography allows acquiring these key parameters throughout the sample volume at the required resolution in a non-destructive way. By performing a nanotomography measurement at the PETRA III beamline P05 on a photonic glass film, the packing fraction throughout the complete sample thickness was analyzed. The results showed a packing fraction significantly smaller than the expected random close packing giving important information for improving the fabrication and processing methods of photonic glass material in the future.

DOI: 10.1107/S1600577516012960
Zitationen: 7
Web of Science
Zitationen: 7
Zitationen: 8
Zugehörige Institution(en) am KIT Institut für Mikrostrukturtechnik (IMT)
Universität Karlsruhe (TH) – Interfakultative Einrichtungen (Interfakultative Einrichtungen)
Karlsruhe Nano Micro Facility (KNMF)
Karlsruhe School of Optics & Photonics (KSOP)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2016
Sprache Englisch
Identifikator ISSN: 1600-5775, 0909-0495
KITopen-ID: 1000062557
HGF-Programm 43.23.03 (POF III, LK 01) Teratronics
Erschienen in Journal of synchrotron radiation
Verlag International Union of Crystallography
Band 23
Heft 6
Seiten 1440–1446
Schlagwörter nanotomography, photonic glass, X-ray microscopy
Nachgewiesen in Dimensions
Web of Science
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