KIT | KIT-Bibliothek | Impressum | Datenschutz

Assessment of the Measurement Procedure for Dimensional Metrology with X-ray Computed Tomography

Kraemer, Alexandra 1; Lanza, Gisela 1
1 Institut für Produktionstechnik (WBK), Karlsruher Institut für Technologie (KIT)


X-ray computed tomography (CT) is a promising technology for quality assurance of industrial parts. However, computed tomography for dimensional metrology is a complex and indirect measurement procedure, whose results depend on a variety of influencing factors. To ensure that a measurement is traceable back to the basic SI units, a statement about the measurement uncertainty has to be given together with the actual measurement result. A generally accepted method for uncertainty evaluation is the use of calibrated workpieces. However, the influencing factors throughout the measurement procedure that contribute to the uncertainty are not quantified individually and remain unknown. The quality and reliability of the measurement, expressed in measurement uncertainty, hereby depends on hard- and software as well as user-set scan parameters. Not only scan parameters, such as current, tube voltage or exposure time, can influence the measurement results, but also surface determination and geometrical evaluation of the measured features add to the measurement uncertainty.

In this contribution, the measurement procedure for metrological computed tomography is assessed and influencing factors throughout the different steps in the measurement procedure are identified as well as quantified. ... mehr

Verlagsausgabe §
DOI: 10.5445/IR/1000068277
Veröffentlicht am 18.05.2022
DOI: 10.1016/j.procir.2016.02.018
Zitationen: 23
Zitationen: 23
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Produktionstechnik (WBK)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2016
Sprache Englisch
Identifikator ISSN: 2212-8271
KITopen-ID: 1000068277
Erschienen in Procedia CIRP
Verlag Elsevier
Band 43
Seiten 362–367
Bemerkung zur Veröffentlichung 14th CIRP Conference on Computer Aided Tolerancing (CAT 2016), 18 – 20 May 2016, Gothenburg, Sweden
Vorab online veröffentlicht am 09.05.2016
Nachgewiesen in Dimensions
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft
KITopen Landing Page