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All-Angle Invisibility Cloaking of Contact Fingers on Solar Cells by Refractive Free-Form Surfaces

Schumann, Martin F. 1,2; Langenhorst, Malte 3; Smeets, Michael; Ding, Kaining; Paetzold, Ulrich W. ORCID iD icon 3,4; Wegener, Martin 1,2
1 Institut für Angewandte Physik (APH), Karlsruher Institut für Technologie (KIT)
2 Institut für Nanotechnologie (INT), Karlsruher Institut für Technologie (KIT)
3 Institut für Mikrostrukturtechnik (IMT), Karlsruher Institut für Technologie (KIT)
4 Lichttechnisches Institut (LTI), Karlsruher Institut für Technologie (KIT)


This work demonstrates a performance improvement of state-of-the-art silicon solar cells by cloaking their metal contact fingers. The cloaking free-form surfaces are fabricated on silicon heterojunction solar cells using direct laser writing of polymers and subsequent soft imprinting. Cloaking performance is determined experimentally by measuring spatially resolved and angle-resolved current generation and the spectral response of the cell. The short-circuit current density of the cell increases by 7.3%; its power-conversion efficiency is enhanced by 9.3%. Overcompensation of the shadowing loss is found to be caused by improved light-gathering and light-trapping in the polymer layer. The experimental findings are in good agreement to ray-tracing simulations.

DOI: 10.1002/adom.201700164
Zitationen: 28
Zitationen: 28
Zugehörige Institution(en) am KIT Institut für Angewandte Physik (APH)
Institut für Mikrostrukturtechnik (IMT)
Institut für Nanotechnologie (INT)
Universität Karlsruhe (TH) – Interfakultative Einrichtungen (Interfakultative Einrichtungen)
Karlsruhe School of Optics & Photonics (KSOP)
Lichttechnisches Institut (LTI)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2017
Sprache Englisch
Identifikator ISSN: 2195-1071
KITopen-ID: 1000071762
HGF-Programm 43.23.04 (POF III, LK 01) Nanophotonics for Energy Conversion
Erschienen in Advanced optical materials
Verlag John Wiley and Sons
Band 5
Heft 17
Seiten Art. Nr. 1700164
Nachgewiesen in Web of Science
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