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Compression fracture of CFRP laminates containing stress intensifications

Leopold, Christian; Schütt, Martin; Liebig, Wilfried V. ORCID iD icon 1; Philipkowski, Timo; Kürten, Jonas; Schulte, Karl; Fiedler, Bodo
1 Institut für Fahrzeugsystemtechnik (FAST), Karlsruher Institut für Technologie (KIT)


For brittle fracture behaviour of carbon fibre reinforced plastics (CFRP) under compression, several approaches exist, which describe different mechanisms during failure, especially at stress intensifications. The failure process is not only initiated by the buckling fibres, but a shear driven fibre compressive failure beneficiaries or initiates the formation of fibres into a kink-band. Starting from this kink-band further damage can be detected, which leads to the final failure. The subject of this work is an experimental investigation on the influence of ply thickness and stacking sequence in quasi-isotropic CFRP laminates containing stress intensifications under compression loading. Different effects that influence the compression failure and the role the stacking sequence has on damage development and the resulting compressive strength are identified and discussed. The influence of stress intensifications is investigated in detail at a hole in open hole compression (OHC) tests. A proposed interrupted test approach allows identifying the mechanisms of damage initiation and propagation from the free edge of the hole by causing a distinct damage state and examine it at a precise instant of time during fracture process. ... mehr

Volltext §
DOI: 10.5445/IR/1000074172
DOI: 10.3390/ma10091039
Zitationen: 14
Zitationen: 15
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Fahrzeugsystemtechnik (FAST)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2017
Sprache Englisch
Identifikator ISSN: 1996-1944
KITopen-ID: 1000074172
Erschienen in Materials
Verlag MDPI
Band 10
Heft 9
Seiten Art.Nr.: 1039
Schlagwörter stacking sequence, scaling, free-edge, open-hole, compression after impact (CAI), fractography, scanning electron microscopy (SEM), kink-band
Nachgewiesen in Web of Science
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