On the thermal failure in nanoscale devices: Insight towards heat transport including critical BEOL and design guidelines for robust thermal management & EOS/ESD reliability
Shrivastava, Mayank; Agrawal, Manish; Aghassi, Jasmin
; Gossner, Harald; Molzer, Wolfgang; Schulz, Thomas; Ramgopal Rao, V.
; Gossner, Harald; Molzer, Wolfgang; Schulz, Thomas; Ramgopal Rao, V.| Zugehörige Institution(en) am KIT | Institut für Nanotechnologie (INT) |
| Publikationstyp | Proceedingsbeitrag |
| Publikationsjahr | 2011 |
| Sprache | Englisch |
| Identifikator | ISBN: 978-1-4244-9113-1 KITopen-ID: 1000074300 |
| Erschienen in | IEEE International Reliability Physics Symposium (IRPS), Monterey, CA, USA, 10–14 April 2011 |
| Verlag | Institute of Electrical and Electronics Engineers (IEEE) |
| Seiten | 3F.3.1–3F.3.5 |
| Nachgewiesen in | Dimensions Scopus |