Measurements of critical-current diffraction patterns in annular Josephson junctions
Abstract:
We report systematic measurements of the critical current versus magnetic-field patterns of annular Josephson junctions in a wide magnetic-field range. A modulation of the envelope of the pattern, which depends on the junction width, is observed. The data are compared with theory and good agreement is found.
| Zugehörige Institution(en) am KIT | Physikalisches Institut (PHI) |
| Publikationstyp | Zeitschriftenaufsatz |
| Publikationsjahr | 2000 |
| Sprache | Englisch |
| Identifikator | ISSN: 0163-1829, 0556-2805, 1094-1622, 1095-3795, 1098-0121, 1550-235X, 2469-9950, 2469-9969 KITopen-ID: 1000074372 |
| Erschienen in | Physical review / B |
| Verlag | American Physical Society (APS) |
| Band | 62 |
| Heft | 1 |
| Seiten | 119-122 |
| Nachgewiesen in | Dimensions Web of Science Scopus |