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Low-temperature scanning electron microscopy studies of superconducting thin films and Josephson junctions

Gross, R.; Doderer, T.; Huebener, R.P.; Kober, F.; Koelle, D.; Kruelle, C.; Mannhart, J.; Mayer, B.; Quenter, D.; Ustinov, A.

Abstract:
Scanning techniques represent powerful methods for the characterization of condensed matter. Extending Scanning Electron Microscopy (SEM) to the range of low temperatures an interesting tool for studying low-temperature properties of solids with high-spatial and temporal resolution is obtained. By Low-Temperature Scanning Electron Microscopy (LTSEM) important new information on low-temperature phenomena in superconductors, semiconductors, and insulators is obtained by two-dimensional imaging. Here, we summarize the basic principles of LTSEM and show its application to the study of superconducting films and Josephson junctions.



Originalveröffentlichung
DOI: 10.1016/0921-4526(91)90261-C
Scopus
Zitationen: 14
Web of Science
Zitationen: 24
Zugehörige Institution(en) am KIT Physikalisches Institut (PHI)
Publikationstyp Zeitschriftenaufsatz
Jahr 1991
Sprache Englisch
Identifikator ISSN: 0921-4526, 1873-2135
KITopen-ID: 1000078001
Erschienen in Physica / B
Band 169
Heft 1-4
Seiten 415–421
Nachgewiesen in Web of Science
Scopus
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