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Multi-fluxon dynamics in inhomogeneous Josephson junctions: experiment

Ustinov, A.V.

Long Nb-NbO-Pb Josephson junctions with artificially formed SiO inhomogeneities in the insulator layer have been studied. A fine structure has been observed on the current-voltage characteristics of the junctions. Such structure is considered to be due to the resonant interaction between the fluxon and its radiation. The single-fluxon effect in the zero magnetic field and the multifluxon effect in a large field have been studied experimentally. The results are compared with those of the perturbation theory and numerical simulation. A multifluxon-chain pinning effect observed in the commensurable lattice of inhomogeneities is reported and discussed.

DOI: 10.1109/20.92567
Zitationen: 5
Web of Science
Zitationen: 5
Zitationen: 5
Zugehörige Institution(en) am KIT Physikalisches Institut (PHI)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 03.1989
Sprache Englisch
Identifikator ISSN: 0018-9464, 1941-0069
KITopen-ID: 1000078056
Erschienen in IEEE transactions on magnetics
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Band 25
Heft 2
Seiten 1440–1443
Nachgewiesen in Dimensions
Web of Science
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