At-wavelength optics characterisation via X-ray speckle- and grating-based unified modulated pattern analysis

The current advances in new generation X-ray sources are calling for the development
and improvement of high-performance optics. Techniques for high-sensitivity phase sensing
and wavefront characterisation, preferably performed at-wavelength, are increasingly required
for quality control, optimisation and development of such devices. We here show that the
recently proposed unified modulated pattern analysis (UMPA) can be used for these purposes.
We characterised two polymer X-ray refractive lenses and quantified the effect of beam damage
and shape errors on their refractive properties. Measurements were performed with two different
setups for UMPA and validated with conventional X-ray grating interferometry. Due to its
adaptability to different setups, the ease of implementation and cost-effectiveness, we expect
UMPA to find applications for high-throughput quantitative optics characterisation and wavefront
sensing.