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DOI: 10.5445/IR/1000082218
Veröffentlicht am 20.04.2018

First transmission of electrons and ions through the KATRIN beamline

KATRIN Collaboration; Arenz, M.; Baek, W.-J.; Beck, M.; Beglarian, A.; Behrens, J.; Bergmann, T.; Berlev, A.; Besserer, U.; Blaum, K.; Bode, T.; Bornschein, B.; Bornschein, L.; Brunst, T.; Buzinsky, N.; Chilingaryan, S.; Choi, W.Q.; Deffert, M.; Doe, P.J.; Dragoun, O.; Drexlin, G.; ... mehr

The Karlsruhe Tritium Neutrino (KATRIN) experiment is a large-scale effort to probe the absolute neutrino mass scale with a sensitivity of 0.2 eV (90% confidence level), via a precise measurement of the endpoint spectrum of tritium ß-decay. This work documents several KATRIN commissioning milestones: the complete assembly of the experimental beamline, the successful transmission of electrons from three sources through the beamline to the primary detector, and tests of ion transport and retention. In the First Light commissioning campaign of autumn 2016, photoelectrons were generated at the rear wall and ions were created by a dedicated ion source attached to the rear section; in July 2017, gaseous 83mKr was injected into the KATRIN source section, and a condensed 83mKr source was deployed in the transport section. In this paper we describe the technical details of the apparatus and the configuration for each measurement, and give first results on source and system performance. We have successfully achieved transmission from all four sources, established system stability, and characterized many aspects of the apparatus.

Zugehörige Institution(en) am KIT Institut für Prozessdatenverarbeitung und Elektronik (IPE)
Institut für Kernphysik (IKP)
Institut für Experimentelle Teilchenphysik (ETP)
Publikationstyp Zeitschriftenaufsatz
Jahr 2018
Sprache Englisch
Identifikator ISSN: 1748-0221
URN: urn:nbn:de:swb:90-822183
KITopen ID: 1000082218
HGF-Programm 51.03.01; LK 01
Erschienen in Journal of Instrumentation
Band 13
Heft 04
Seiten P04020
Schlagworte Spectrometers; Beam-line instrumentation (beam position and profile monitors; beamintensity monitors; bunch length monitors); Detector control systems (detector and experiment monitoring and slow-control systems, architecture, hardware, algorithms, databases); Ion sources (positive ions, negative ions, electron cyclotron resonance (ECR), electron beam (EBIS))
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