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UFO — a scalable platform for high-speed synchrotron X-ray imaging

Kopmann, Andreas ORCID iD icon 1; Chilingaryan, Suren ORCID iD icon 1; Vogelgesang, Matthias 1; Dritschler, Timo ORCID iD icon 1; Shkarin, Andrey 1; Shkarin, Roman 1; Santos Rolo, Tomy dos; Farago, Tomas 1; Kamp, Thomas Van de; Balzer, Matthias 1; Caselle, Michele 1; Weber, Marc 1
1 Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

New imaging stations aim for high spatial and temporal resolution and are characterized by ever increasing sampling rates and demanding data processing workflows. Key to successful imaging experiments is to open up high-performance computing resources. This includes carefully selected components for computing hardware and development of advanced imaging algorithms optimized for efficient use of parallel processor architectures. We present the novel UFO computing platform for online data processing for imaging experiments and image-based feedback. The platform handles the full data life cycle from the X-ray detector to long-term data archives. Core components of this system are an FPGA platform for ultra-fast data acquisition, the GPU-based UFO image processing framework, and the fast control system “Concert”. Reconstruction algorithms implemented in the UFO framework are optimized for the latest GPU architectures and provide a reconstruction throughput in the GB/s-range. The control system “Concert” integrates high-speed computing nodes and fast beamline devices and thus enables image-based control loops and advanced workflow automation for efficient beam time usage. ... mehr

DOI: 10.1109/NSSMIC.2016.8069895
Zitationen: 2
Zitationen: 2
Zugehörige Institution(en) am KIT Institut für Photonenforschung und Synchrotronstrahlung (IPS)
Institut für Prozessdatenverarbeitung und Elektronik (IPE)
Publikationstyp Proceedingsbeitrag
Publikationsmonat/-jahr 10.2016
Sprache Englisch
Identifikator ISBN: 978-1-5090-1642-6
KITopen-ID: 1000083259
HGF-Programm 54.02.02 (POF III, LK 01) Ultraschnelle Datenauswertung
Erschienen in 2016 IEEE Nuclear Science Symposium, Medical Imaging Conference and Room-Temperature Semiconductor Detector Workshop (NSS/MIC/RTSD), Strasbourg, France, 29 October–6 November 2016
Verlag Institute of Electrical and Electronics Engineers (IEEE)
Seiten 1–5
Nachgewiesen in Dimensions
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