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DOI: 10.1017/S1431927617004408

Imaging the Structural Evolution in Nanocrystalline Metals during Mechanical Deformation

Kübel, C.; Kobler, A.; Kashiwar, A.; Hahn, H.

Abstract (englisch):
Most of our current understanding of the deformation mechanisms active in nanocrystalline (nc) metals stems from in situ deformation experiments on bulk materials using x-ray diffraction (XRD). However, XRD cannot directly resolve the local deformation processes. For a local analysis, these processes are traditionally investigated using BF/DF TEM. However, varying contrast due to local orientation changes, bending and defects during in situ BF-TEM straining experiments make an accurate interpretation for nanometer sized grains difficult. On the other hand, automated crystal orientation mapping (ACOM-TEM) [1] allows to identify the crystallographic orientation of all crystallites with sizes down to around 10 nm, well below the limit of electron back scatter diffraction (EBSD). Performing ACOM-TEM in µp-STEM mode allows to image grain orientations in situ during straining inside a TEM [2, 3]. This combination was key to a new data evaluation based on orientation maps. By tracking individual crystallites through a straining series the change of their orientation can be evaluated in order to distinguish between local crystallite rotatio ... mehr

Zugehörige Institution(en) am KIT Institut für Nanotechnologie (INT)
Karlsruhe Nano Micro Facility (KNMF)
Publikationstyp Zeitschriftenaufsatz
Jahr 2017
Sprache Englisch
Identifikator ISSN: 1431-9276, 1435-8115
KITopen ID: 1000085075
Erschienen in Microscopy and microanalysis
Band 23
Heft S1
Seiten 748–749
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