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Imaging the Structural Evolution in Nanocrystalline Metals during Mechanical Deformation

Kübel, C.; Kobler, A.; Kashiwar, A.; Hahn, H.

Abstract (englisch):
Most of our current understanding of the deformation mechanisms active in nanocrystalline (nc) metals stems from in situ deformation experiments on bulk materials using x-ray diffraction (XRD). However, XRD cannot directly resolve the local deformation processes. For a local analysis, these processes are traditionally investigated using BF/DF TEM. However, varying contrast due to local orientation changes, bending and defects during in situ BF-TEM straining experiments make an accurate interpretation for nanometer sized grains difficult. On the other hand, automated crystal orientation mapping (ACOM-TEM) [1] allows to identify the crystallographic orientation of all crystallites with sizes down to around 10 nm, well below the limit of electron back scatter diffraction (EBSD). Performing ACOM-TEM in µp-STEM mode allows to image grain orientations in situ during straining inside a TEM [2, 3]. This combination was key to a new data evaluation based on orientation maps. By tracking individual crystallites through a straining series the change of their orientation can be evaluated in order to distinguish between local crystallite rotatio ... mehr

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Originalveröffentlichung
DOI: 10.1017/S1431927617004408
Zugehörige Institution(en) am KIT Institut für Nanotechnologie (INT)
Karlsruhe Nano Micro Facility (KNMF)
Publikationstyp Zeitschriftenaufsatz
Jahr 2017
Sprache Englisch
Identifikator ISSN: 1431-9276, 1435-8115
KITopen-ID: 1000085075
HGF-Programm 43.22.01 (POF III, LK 01)
Erschienen in Microscopy and microanalysis
Band 23
Heft S1
Seiten 748–749
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