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DOI: 10.5445/IR/1000085428
Veröffentlicht am 22.08.2018

Real time in situ x-ray diffraction study of the crystalline structure modification of Ba0.5Sr0.5TiO₃ during the post-annealing

Bauer, Sondes; Rodrigues, Adriana; Baumbach, Tilo

Abstract:
We report about an in situ study of crystalline structural changes during thermal treatment of a Ba0.5Sr0.5TiO3 (BSTO) film grown on MgO. The study covers the complete cycle of heating, annealing and cooling and reveals simultaneous phenomena of phase transitions and strain evolution, which have been characterized by in situ 2D reciprocal space mapping (2D-RSM) using high-resolution synchrotron x-ray diffraction in coplanar and grazing incidence geometries. In this way, temperature induced phase transformation from the BSTO2 to the BSTO1 phase has been monitored and the appearance of a further crystalline phase was detected. Moreover, for both BSTO phases, transitions between in-plane compressive and tensile states have been determined during thermal treatment. Furthermore, a contraction of the out-of-plane lattice components has been observed during the annealing phase while the in-plane lattice components remain leading to the change of the residual in-plane strain towards tensile state. The in situ 2D-RSM findings provide valuable and versatile insights into strain engineering and structure modification upon thermal treatment.


Zugehörige Institution(en) am KIT Laboratorium für Applikationen der Synchrotronstrahlung (LAS)
Institut für Photonenforschung und Synchrotronstrahlung (IPS)
Publikationstyp Zeitschriftenaufsatz
Jahr 2018
Sprache Englisch
Identifikator ISSN: 2045-2322
URN: urn:nbn:de:swb:90-854288
KITopen ID: 1000085428
HGF-Programm 56.03.20; LK 01
Erschienen in Scientific reports
Band 8
Heft 1
Seiten Article No. 11969
Bemerkung zur Veröffentlichung Gefördert durch den KIT-Publikationsfonds
Vorab online veröffentlicht am 10.08.2018
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