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Verlagsausgabe
DOI: 10.5445/IR/1000086762
Veröffentlicht am 22.10.2018

Modeling the unified measurement uncertainty of deflectometric and plenoptic 3-D sensors

Ziebarth, Mathias; Zeller, Niclas; Heizmann, Michael; Quint, Franz

Abstract:
In this paper we propose new models of two complementary optical sensors to obtain 2.5-D measurements of opaque surfaces: a deflectometric and a plenoptic sensor. The deflectometric sensor uses active triangulation and works best on specular surfaces, while the plenoptic sensor uses passive triangulation and works best on textured, diffusely reflecting surfaces. We propose models to describe the measurement uncer-
tainties of the sensors for specularly to diffusely reflecting surfaces under consideration of typical disturbances like ambient light or vibration. The predicted measurement uncertainties of both sensors can be used to obtain optimized measurements uncertainties for varying surface properties on the basis of a combined sensor system. The models are validated exemplarily based on real measurements.


Zugehörige Institution(en) am KIT Institut für Industrielle Informationstechnik (IIIT)
Publikationstyp Zeitschriftenaufsatz
Jahr 2018
Sprache Englisch
Identifikator ISSN: 2194-8771, 2194-878X
URN: urn:nbn:de:swb:90-867629
KITopen ID: 1000086762
Erschienen in Journal of sensors and sensor systems
Band 7
Heft 2
Seiten 517-533
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