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High repetition-rate electro-optic sampling: Recent studies using photonic time-stretch

Evain, C.; Szwaj, C.; Roussel, E.; Le Parquier, M.; Bielawski, S.; Roussel, E.; Brubach, J.-B.; Manceron, L.; Tordeux, M.-A.; Labat, M.; Roy, P.; Hiller, N.; Blomley, E. ORCID iD icon; Funkner, S.; Bründermann, E. ORCID iD icon; Nasse, M. J.; Niehues, G. 1; Schönfeldt, P. 1; Schuh, M. ORCID iD icon 1; ... mehr

Abstract:

Single-shot electro-optic sampling (EOS) is a powerful characterization tool for monitoring the shape of electron bunches, and coherent synchrotron radiation pulses. For reaching high acquisition rates, an efficient possibility consists to associate classic EOS systems with the so-called photonic time-stretch technique [1]. We present recent results obtained at SOLEIL and ANKA using this strategy. In particular, we show how a high sensitivity variant of photonic time stretch [2] EOS enabled to monitor the CSR pulses emitted by short electron bunches at SOLEIL [3]. We could thus confirm in a very direct way the theories predicting an interplay between two physical processes. Below a critical bunch charge, we observe a train of identical THz pulses stemming from the shortness of the electron bunches. Above this threshold, CSR emission is dominated by drifting structures appearing through spontaneous self-organization. We also consider the association of time-stretch and EOS for recording electron bunch near fields at high repetition rate. We present preliminary results obtained at ANKA, aiming at recording the electron bunch shape evolution during the microbunching instability.


Verlagsausgabe §
DOI: 10.5445/IR/1000098676
Veröffentlicht am 09.10.2019
Originalveröffentlichung
DOI: 10.18429/JACoW-IBIC2017-TU1AB2
Scopus
Zitationen: 2
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Beschleunigerphysik und Technologie (IBPT)
Institut für Prozessdatenverarbeitung und Elektronik (IPE)
Laboratorium für Applikationen der Synchrotronstrahlung (LAS)
Publikationstyp Proceedingsbeitrag
Publikationsjahr 2018
Sprache Englisch
Identifikator ISBN: 978-3-9545019-2-2
KITopen-ID: 1000098676
HGF-Programm 54.01.01 (POF III, LK 01) ps- und fs-Strahlen
Weitere HGF-Programme 54.02.02 (POF III, LK 01) Ultraschnelle Datenauswertung
Erschienen in IBIC 2017- International Beam Instrumentation Conference : 20-24 August 2017, Grand Rapids, Michigan, Amway Grand Plaza Hotel / hosted by Facility for Rare Isotope Beams. Ed.: E. Akers
Veranstaltung 6th International Beam Instrumentation Conference (IBIC 2017), Grand Rapids, MI, USA, 20.08.2017 – 24.08.2017
Verlag JACoW Publishing
Seiten 121-124
Nachgewiesen in Scopus
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