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Dielectric monitoring of the pan fiber stabilization process

Hofele, Julia 1; Link, Guido 1; Jelonnek, John 1
1 Institut für Hochleistungsimpuls- und Mikrowellentechnik (IHM), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

The production of carbon fibers based on Polyacrylonitrile (PAN) precursor fibers is a very energy intensive process. In order to increase the energy efficiency, microwave plasma processes and, alternatively, dielectric heating with microwaves are in the focus. In this latter case, the knowledge of the dielectric properties over temperature is the key in the design of an appropriate microwave heating system. A measurement system was developed that is capable to monitor in-situ the change of the dielectric properties during the stabilization process of the PAN fiber. First results show that the loss tangent of the PAN fiber is strongly varying with temperature. Additionally, the dielectric properties are changing during the stabilization process due to the chemical transformation.


Verlagsausgabe §
DOI: 10.5445/IR/1000099297
Veröffentlicht am 25.10.2019
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Hochfrequenztechnik und Elektronik (IHE)
Institut für Hochleistungsimpuls- und Mikrowellentechnik (IHM)
Publikationstyp Proceedingsbeitrag
Publikationsjahr 2019
Sprache Englisch
Identifikator ISBN: 978-84-9048-719-8
KITopen-ID: 1000099297
HGF-Programm 34.12.01 (POF III, LK 01) Multiphasen und thermische Prozesse
Erschienen in Proceedings 17th International Conference on Microwave and High Frequency Heating (AMPERE 2019), Valencia, E, September 9-12, 2019
Veranstaltung 17th International Conference on Microwave and High Frequency Heating (2019), Valencia, Spanien, 09.09.2019 – 12.09.2019
Verlag Universitat Politècnica de València
Seiten 365-372
Projektinformation REINFORCE (BMWK, ZF4204603SY7)
Vorab online veröffentlicht am 09.09.2019
Schlagwörter dielectric measurements, microwave heating, in-situ monitoring, PAN fiber, carbon fiber production
Nachgewiesen in Scopus
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