Quartz single crystal thermal diffusivity measurements by laser flash method: from -120 °C through the α-β phase transition to 800 °C

Laser-Flash-Apparatus: Netzsch LFA 457, InSb and HgCdTe IR Detectors

Raw data on single crystal quartz thermal diffusivity are given as .csv data within the corresponding sample folders:
"LT" refers to low temperature (-120 °C to 400 °C), "HT" to high temperature (25 °C to 800 °C) measurements.
"_001" or "_100" of the folder and .csv file names denote the measured crystallographic direction, i.e. [100] (a-axis) and [001] (c-axis), respectively.

All .csv data contain a header with information on the measurement followed by the data in columns "Time /ms" and "Detector /V".

Thicknesses within the header information are given as room temperature (RT) thicknesses.
They are approx. 2 mm for "HT1" specimens, approx. 4 mm and 4.7 mm for "HT2" specimens and approx. 10 mm for "Qz_cube" specimens.

Information on the laser pulse used for the measurements can be found in the header information for the pulse power (e.g. "#Laser_voltage/V;1538,0") and filter settings that were used (e.g. "#Laser_filter/mm;100,0").

For finite pulse-time effect consideration[1], corresponding exemplary laser pulse profiles can be found in the folder "Laserpulse".
[1] e.g., see: Breuer, S. and Schilling, F. R.: Improving Thermal Diffusivity Measurements by Including Detector Inherent Delayed Response in Laser Flash Method, Int J Thermophys, 40, 95, https://doi.org/10.1007/s10765-019-2562-9, 2019)