KIT | KIT-Bibliothek | Impressum | Datenschutz

v-K-data for silica from interrupted lifetime measurements

Sglavo, V.; Fett. T.; Schell, K. G. ORCID iD icon; Hoffmann, M. J.; Wiederhorn, S. M.

Abstract:

Different methods were applied so far in order to determine subcritical crack growth for silica. Mostly, fracture mechanics standard tests with macro cracks were used for this purpose. In this report, we evaluated the subcritical crack growth curves from interrupted lifetime tests on silica bending specimens containing small natural flaws. The resulting v-K-curve showed crack growth rates down to 1014 m/s indicating a threshold for subcritical crack growth at
Kth0.31 MPam
In the plot of v=f(K/KIc) slight material differences could be eliminated and suitable agreement with macro-crack results by Wiederhorn and Bolz [1] on DCB-specimens and Michalske et al. [2] on DCDC-specimens could be stated.

Zugehörige Institution(en) am KIT Institut für Angewandte Materialien – Keramische Werkstoffe und Technologien (IAM-KWT1)
Publikationstyp Forschungsbericht/Preprint
Publikationsjahr 2020
Sprache Deutsch
Identifikator ISSN: 2194-1629
KITopen-ID: 1000120054
Verlag Karlsruher Institut für Technologie (KIT)
Umfang VI, 7 S.
Serie KIT Scientific Working Papers ; 144
Nachgewiesen in OpenAlex

Volltext §
DOI: 10.5445/IR/1000120054
Veröffentlicht am 08.06.2020
Seitenaufrufe: 152
seit 08.06.2020
Downloads: 61
seit 08.06.2020
Cover der Publikation
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft
KITopen Landing Page