A multi-dimensional full automatic power semiconductor test bench for accurate semiconductor loss calculation
| Zugehörige Institution(en) am KIT | Elektrotechnisches Institut (ETI) |
| Publikationstyp | Proceedingsbeitrag |
| Publikationsjahr | 2019 |
| Sprache | Englisch |
| Identifikator | ISBN: 978-3-8007-4938-6 ISSN: 2191-3358 KITopen-ID: 1000122447 |
| HGF-Programm | 37.06.01 (POF III, LK 01) Networks and Storage Integration |
| Erschienen in | International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (PCIM Europe 2019), Nürnberg, 7.-9. Mai 2019 |
| Veranstaltung | PCIM Europe 2019 : International Exhibition and Conference for Power Electronics, Intelligent Motion, Renewable Energy and Energy Management (2019), Nürnberg, Deutschland, 07.05.2019 – 09.05.2019 |
| Seiten | 1411-1418 |
| Serie | Conference proceedings |
| Nachgewiesen in | Scopus |