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Combined In Situ XRD and Ex Situ TEM Studies of Thin Ba$_{0.5}$Sr$_{0.5}$TiO$_{3}$ Films Grown by PLD on MgO

Bauer, Sondes 1; Rodrigues, Adriana 1; Jin, Xiaowei 2; Schneider, Reinhard 2; Müller, Erich 2; Gerthsen, Dagmar 2; Baumbach, Tilo 1,3
1 Institut für Photonenforschung und Synchrotronstrahlung (IPS), Karlsruher Institut für Technologie (KIT)
2 Laboratorium für Elektronenmikroskopie (LEM), Karlsruher Institut für Technologie (KIT)
3 Laboratorium für Applikationen der Synchrotronstrahlung (LAS), Karlsruher Institut für Technologie (KIT)


Dielectric barium strontium titanate films were deposited on MgO (001) substrate by pulsed‐laser deposition (PLD) and monitored in situ by means of reflection high‐energy electron diffraction and time‐resolved X‐ray diffraction (TRXRD). TRXRD showed two growth periods of the BSTO film and a transformation in the crystalline structure was detected as the thickness exceeds 80 nm. The occurrence of two different crystalline regions, namely BSTO1 and BSTO2 was proved by X‐ray diffraction (XRD). Ex situ transmission electron microscopy (TEM) techniques, including diffraction‐contrast as well as high‐resolution TEM, nanobeam electron diffraction, and scanning TEM in combination with energy‐dispersive X‐ray spectroscopy reveal structural and microchemical peculiarities of the BSTO film. By these TEM analyses, the presence of the two different regions BSTO1 and BSTO2 within the PLD‐grown BSTO layer was demonstrated. Regions of phase BSTO2 were found on top of nanoscaled MgO islands formed on the substrate surface during annealing at high temperature. While the majority phase BSTO1 has a single‐crystalline structure over wide ranges, BSTO2 regions seem to be poly‐ or even nanocrystalline, and the chemical composition of the two phases is also different. ... mehr

Verlagsausgabe §
DOI: 10.5445/IR/1000122482
Veröffentlicht am 25.08.2020
DOI: 10.1002/crat.201900235
Zitationen: 2
Zitationen: 3
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Photonenforschung und Synchrotronstrahlung (IPS)
Laboratorium für Applikationen der Synchrotronstrahlung (LAS)
Laboratorium für Elektronenmikroskopie (LEM)
Universität Karlsruhe (TH) – Zentrale Einrichtungen (Zentrale Einrichtungen)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 09.2020
Sprache Englisch
Identifikator ISSN: 0232-1300
KITopen-ID: 1000122482
HGF-Programm 56.03.20 (POF III, LK 01) Nanoscience a.Material f.Inform.Technol.
Erschienen in Crystal research and technology
Verlag Wiley-VCH Verlag
Band 55
Heft 9
Seiten Art. Nr.: 1900235
Bemerkung zur Veröffentlichung Special Issue: Dedicated to Prof. W. Neumann on his 75th Birthday
Vorab online veröffentlicht am 20.07.2020
Nachgewiesen in Scopus
Web of Science
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