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Elucidating the microstructure of tungsten composite materials produced by powder injection molding

Duerrschnabel, Michael; Antusch, Steffen; Holtermann, Birger; Jaentsch, Ute; Baumgaertner, Siegfried; Bonnekoh, Carsten; Hoffmann, Mirjam; Hoffmann, Jan; Rieth, Michael

Abstract (englisch):
A detailed microstructural analysis is one key factor for establishing structure–property relationships, which themselves are essential for manufacturing any device or part thereof. In particular, this paper focuses on the microstructural analysis of tungsten composite materials produced by powder injection molding (PIM). Our combined scanning electron microscopy (SEM) and transmission electron microscopy (TEM) approach revealed that W/TiC and W/Y2O3 composites are promising candidates for e.g. plasma facing components in future fusion reactors. The grains size distribution of all present phases was a log-normal one. TiC and Y2O3 precipitates in contrast to HfC ones limited the grain growth of the tungsten matrix during sintering about three times more efficient. The precipitate grain size was for all samples in the range of 1.7 µm–3.5 µm. Chemical interaction was only observed for TiC-based composites in the form of W diffusion into the TiC precipitate forming a mixed (Ti, W) carbide retaining the face-centered cubic (fcc) based crystal structure of pure TiC. The tungsten content in Y2O3 and HfC precipitates was found to be negligible. ... mehr

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Verlagsausgabe §
DOI: 10.5445/IR/1000122873
Veröffentlicht am 19.11.2020
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Angewandte Materialien - Werkstoffkunde (IAM-WK)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 08.2020
Sprache Englisch
Identifikator ISSN: 2352-1791
KITopen-ID: 1000122873
HGF-Programm 31.03.07 (POF III, LK 01) Divertortechnologie
Erschienen in Nuclear materials and energy
Verlag Elsevier
Band 24
Seiten Art. Nr.: 100766
Schlagwörter Powder injection molding (PIM), Tungsten, Doped tungsten materials, Scanning electron, Analytical transmission electron microscopy (ATEM)microscopy (SEM), Mechanical properties
Nachgewiesen in Dimensions
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