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Reproducibility of two calibration procedures for phase-measuring deflectometry

Allgeier, Stephan ORCID iD icon 1; Gengenbach, Ulrich 1; Köhler, Bernd 1; Reichert, Klaus-Martin; Hagenmeyer, Veit 1
1 Institut für Automation und angewandte Informatik (IAI), Karlsruher Institut für Technologie (KIT)

Abstract (englisch):

Phase-measuring deflectometry is an optical inspection technique for reflective surfaces. It enables absolute, quantitative surface measurements, given a calibrated measurement setup. Two general calibration approaches can be found in literature: First, the stepwise approach uses a calibration pattern and determines internal camera parameters and external geometrical parameters in separate, consecutive steps. Second, the holistic approach optimizes all parameters collectively, based on deflectometric measurements of a calibration mirror. Whereas both approaches have been compared regarding the accuracy of subsequent surface measurements, the present contribution focuses on experimental examination of their reproducibility. In experiment E1, we assess the parameter variability by repeating both calibration procedures ten times. In an additional experiment E2, we repeat all calibration measurements related to a mirror/pattern position ten times in a row before rearranging the mirror/pattern, in order to examine the purely noise-related parameter variability. Finally, we calculate the coordinate variability of a set of world points projected onto the image planes of the calibrated cameras. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000122875
Veröffentlicht am 14.05.2021
Originalveröffentlichung
DOI: 10.1117/12.2567092
Scopus
Zitationen: 2
Dimensions
Zitationen: 2
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Automation und angewandte Informatik (IAI)
Publikationstyp Proceedingsbeitrag
Publikationsdatum 21.08.2020
Sprache Englisch
Identifikator ISBN: 978-1-5106-3787-0
KITopen-ID: 1000122875
HGF-Programm 43.22.03 (POF III, LK 01) Printed Materials and Systems
Erschienen in Interferometry XX : 24 August - 4 September 2020, online only, United States. Ed.: M.B. North Morris
Veranstaltung Interferometry (2020), Online, 24.08.2020 – 04.09.2020
Verlag Society of Photo-optical Instrumentation Engineers (SPIE)
Seiten 14
Serie Proceedings of SPIE ; 11490
Nachgewiesen in Dimensions
Scopus
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