# High-temperature etching of SiC in SF$_{6}$/O$_{2}$ inductively coupled plasma

Osipov, A. A.; Iankevich, Gleb A.; Speshilova, A. B.; Osipov, A. A.; Endiiarova, E. V.; Berezenko, V. I.; Tyurikova, I. A.; Tyurikov, K. S.; Alexandrov, S. E.

##### Abstract:
In this work, we demonstrate an effective way of deep (30 µm depth), highly oriented (90° sidewall angle) structures formation with sub-nanometer surface roughness (R$_{ms}$ = 0.7 nm) in silicon carbide (SiC). These structures were obtained by dry etching in SF$_{6}$/O$_{2}$ inductively coupled plasma (ICP) at increased substrate holder temperatures. It was shown that change in the temperature of the substrate holder in the range from 100 to 300 °C leads to a sharp decrease in the root mean square roughness from 153 to 0.7 nm. Along with this, it has been established that the etching rate of SiC also depends on the temperature of the substrate holder and reaches its maximum (1.28 µm/min) at temperatures close to 150 °C. Further temperature increase to 300 °C does not lead to the etching rate rising. The comparison of the results of the thermally stimulated process and the etching with a water-cooled substrate holder (15 °C) is carried out. Plasma optical emission spectroscopy was carried out at different temperatures of the substrate holder.

 Zugehörige Institution(en) am KIT Institut für Nanotechnologie (INT) Publikationstyp Zeitschriftenaufsatz Publikationsjahr 2020 Sprache Englisch Identifikator ISSN: 2045-2322 KITopen-ID: 1000126933 HGF-Programm 43.22.01 (POF III, LK 01) Functionality by Design Erschienen in Scientific reports Verlag Nature Research Band 10 Heft 1 Seiten Art.-Nr.: 19977 Nachgewiesen in Web of ScienceDimensionsScopus
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