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High-temperature etching of SiC in SF$_{6}$/O$_{2}$ inductively coupled plasma

Osipov, A. A.; Iankevich, Gleb A.; Speshilova, A. B.; Osipov, A. A.; Endiiarova, E. V.; Berezenko, V. I.; Tyurikova, I. A.; Tyurikov, K. S.; Alexandrov, S. E.

In this work, we demonstrate an effective way of deep (30 µm depth), highly oriented (90° sidewall angle) structures formation with sub-nanometer surface roughness (R$_{ms}$ = 0.7 nm) in silicon carbide (SiC). These structures were obtained by dry etching in SF$_{6}$/O$_{2}$ inductively coupled plasma (ICP) at increased substrate holder temperatures. It was shown that change in the temperature of the substrate holder in the range from 100 to 300 °C leads to a sharp decrease in the root mean square roughness from 153 to 0.7 nm. Along with this, it has been established that the etching rate of SiC also depends on the temperature of the substrate holder and reaches its maximum (1.28 µm/min) at temperatures close to 150 °C. Further temperature increase to 300 °C does not lead to the etching rate rising. The comparison of the results of the thermally stimulated process and the etching with a water-cooled substrate holder (15 °C) is carried out. Plasma optical emission spectroscopy was carried out at different temperatures of the substrate holder.

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Verlagsausgabe §
DOI: 10.5445/IR/1000126933
Veröffentlicht am 01.12.2020
DOI: 10.1038/s41598-020-77083-1
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Nanotechnologie (INT)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2020
Sprache Englisch
Identifikator ISSN: 2045-2322
KITopen-ID: 1000126933
HGF-Programm 43.22.01 (POF III, LK 01) Functionality by Design
Erschienen in Scientific reports
Verlag Nature Research
Band 10
Heft 1
Seiten Art.-Nr.: 19977
Nachgewiesen in Scopus
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