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A study of the radiation tolerance of cvd diamond to 70 mev protons, fast neutrons and 200 mev pions

Bäni, L.; Alexopoulos, A.; Artuso, M.; Bachmair, F.; Bartosik, M. R.; Beck, H. C.; Bellini, V.; Belyaev, V.; Bentele, B.; Bes, A.; Brom, J.-M.; Chiodini, G.; Chren, D.; Cindro, V.; Claus, G.; Collot, J.; Cumalat, J.; Curtoni, S.; Dabrowski, A. E.; ... mehr

Abstract:

We measured the radiation tolerance of commercially available diamonds grown by the Chemical Vapor Deposition process by measuring the charge created by a 120 GeV hadron beam in a 50 μm pitch strip detector fabricated on each diamond sample before and after irradiation. We irradiated one group of samples with 70 MeV protons, a second group of samples with fast reactor neutrons (defined as energy greater than 0.1 MeV), and a third group of samples with 200 MeV pions, in steps, to (8.8±0.9) × 10$^{15}$ protons/cm$^{2}$, (1.43±0.14) × 10$^{16}$ neutrons/cm$^{2}$, and (6.5±1.4) × 1014 pions/cm$^{2}$, respectively. By observing the charge induced due to the separation of electron–hole pairs created by the passage of the hadron beam through each sample, on an event-by-event basis, as a function of irradiation fluence, we conclude all datasets can be described by a first-order damage equation and independently calculate the damage constant for 70 MeV protons, fast reactor neutrons, and 200 MeV pions. We find the damage constant for diamond irradiated with 70 MeV protons to be 1.62±0.07(stat)±0.16(syst)× 10−18 cm$^{2}$/(pμm), the damage constant for diamond irradiated with fast reactor neutrons to be 2.65±0.13(stat)±0.18(syst)× 10−18 cm$^{2}$/(nμm), and the damage constant for diamond irradiated with 200 MeV pions to be 2.0±0.2(stat)±0.5(syst)× 10−18 cm$^{2}$/(πμm). ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000126944
Veröffentlicht am 30.11.2020
Originalveröffentlichung
DOI: 10.3390/s20226648
Scopus
Zitationen: 10
Dimensions
Zitationen: 12
Cover der Publikation
Zugehörige Institution(en) am KIT Fakultät für Physik – Institut für Experimentelle Kernphysik (IEKP)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2020
Sprache Englisch
Identifikator ISSN: 1424-8220
KITopen-ID: 1000126944
Erschienen in Sensors
Verlag MDPI
Band 20
Heft 22
Seiten Art.-Nr.: 6648
Schlagwörter Chemical Vapor Deposition; single-crystalline diamond; polycrystalline diamond; charge collection distance; mean drift path; schubweg; radiation tolerance; radiation damage constant
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