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Imaging individual solute atoms at crystalline imperfections in metals

Katnagallu, Shyam 1; Stephenson, Leigh T.; Mouton, Isabelle; Freysoldt, Christoph; Subramanyam, Aparna P. A.; Jenke, Jan; Ladines, Alvin N.; Neumeier, Steffen; Hammerschmidt, Thomas; Drautz, Ralf; Neugebauer, Jörg; Vurpillot, François; Raabe, Dierk; Gault, Baptiste
1 Institut für Nanotechnologie (INT), Karlsruher Institut für Technologie (KIT)


Directly imaging all atoms constituting a material and, maybe more importantly, crystalline defects that dictate materials' properties, remains a formidable challenge. Here, we propose a new approach to chemistry-sensitive field-ion microscopy (FIM) combining FIM with time-of-flight mass-spectrometry (tof-ms). Elemental identification and correlation to FIM images enabled by data mining of combined tof-ms delivers a truly analytical-FIM (A-FIM). Contrast variations due to different chemistries is also interpreted from density-functional theory (DFT). A-FIM has true atomic resolution and we demonstrate how the technique can reveal the presence of individual solute atoms at specific positions in the microstructure. The performance of this new technique is showcased in revealing individual Re atoms at crystalline defects formed in Ni–Re binary alloy during creep deformation. The atomistic details offered by A-FIM allowed us to directly compare our results with simulations, and to tackle a long-standing question of how Re extends lifetime of Ni-based superalloys in service at high-temperature.

Verlagsausgabe §
DOI: 10.5445/IR/1000129494
Veröffentlicht am 08.02.2021
DOI: 10.1088/1367-2630/ab5cc4
Zitationen: 20
Web of Science
Zitationen: 17
Zitationen: 24
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Nanotechnologie (INT)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2019
Sprache Englisch
Identifikator ISSN: 1367-2630
KITopen-ID: 1000129494
HGF-Programm 43.22.01 (POF III, LK 01) Functionality by Design
Erschienen in New journal of physics
Verlag Institute of Physics Publishing Ltd (IOP Publishing Ltd)
Band 21
Heft 12
Seiten Art. Nr.: 123020
Vorab online veröffentlicht am 13.12.2019
Schlagwörter analytical-field ion microscopy, time-of-flight mass-spectroscopy, atomic resolution, dislocation segregation, density functional theory
Nachgewiesen in Dimensions
Web of Science
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