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Atomic scale displacements detected by optical image cross-correlation analysis and 3D printed marker arrays

Frenzel, Tobias 1; Köpfler, Julian 1,2; Naber, Andreas 1; Wegener, Martin 1,2
1 Institut für Angewandte Physik (APH), Karlsruher Institut für Technologie (KIT)
2 Institut für Nanotechnologie (INT), Karlsruher Institut für Technologie (KIT)

For analyzing displacement-vector fields in mechanics, for example to characterize the properties of 3D printed mechanical metamaterials, routine high-precision position measurements are indispensable. For this purpose, nanometer-scale localization errors have been achieved by wide-field optical-image cross-correlation analysis. Here, we bring this approach to atomic-scale accuracy by combining it with well-defined 3D printed marker arrays. By using an air-lens with a numerical aperture of 0.4 and a free working distance of 11.2mm, and an 8×8 array of markers with a diameter of 2μm and a period of 5μm, we obtain 2D localization errors as small as 0.9Å in 12.5ms measurement time (80frames/s). The underlying experimental setup is simple, reliable, and inexpensive, and the marker arrays can easily be integrated onto and into complex architectures during their 3D printing process.

Verlagsausgabe §
DOI: 10.5445/IR/1000130163
Veröffentlicht am 01.03.2021
DOI: 10.1038/s41598-021-81712-8
Zitationen: 3
Web of Science
Zitationen: 3
Zitationen: 3
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Angewandte Physik (APH)
Institut für Nanotechnologie (INT)
Universität Karlsruhe (TH) – Interfakultative Einrichtungen (Interfakultative Einrichtungen)
Karlsruhe School of Optics & Photonics (KSOP)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 12.2021
Sprache Englisch
Identifikator ISSN: 2045-2322
KITopen-ID: 1000130163
HGF-Programm 43.32.02 (POF IV, LK 01) Designed Optical Materials
Erschienen in Scientific reports
Verlag Nature Research
Band 11
Heft 1
Seiten Art.-Nr.: 2304
Vorab online veröffentlicht am 27.01.2021
Nachgewiesen in Dimensions
Web of Science
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