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Frequency division multiplex-based light spectroscopy

Missbach, Thomas; Karcher, Christian; Siefer, Gerald; Bett, Andreas W.


Light spectrometers are highly versatile state-of-the-art measurement devices. However, using these systems, e.g., in semiconductor device characterization, creates challenging obstacles with respect to measurement time. We present a new, flexible and accurate approach to either characterize optical properties of arbitrary photosensitive devices or examine the spectral components of light reliably. Using a spatial light modulator (SLM) in combination with frequency division multiplexing methods, it is possible to significantly improve signal-to-noise ratios and decrease measurement times. Moreover, the use of SLM ensures a greater reliability of the setup because conventional moving parts are replaced. The feasibility and experimental setup are described in detail. The setup has been validated for various applications by comparative measurements.

DOI: 10.1364/OE.23.024634
Zitationen: 4
Zitationen: 6
Zugehörige Institution(en) am KIT Universität Karlsruhe (TH) – Interfakultative Einrichtungen (Interfakultative Einrichtungen)
Karlsruhe School of Optics & Photonics (KSOP)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 09.2015
Sprache Englisch
Identifikator ISSN: 1094-4087
KITopen-ID: 1000135916
Erschienen in Optics express
Verlag Optica Publishing Group (OSA)
Band 23
Heft 19
Seiten 24634-24647
Vorab online veröffentlicht am 10.09.2015
Nachgewiesen in Scopus
Web of Science
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