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An extended modular processing pipeline for event-based vision in automatic visual inspection

Beck, Moritz; Maier, Georg; Flitter, Merle; Gruna, Robin; Längle, Thomas; Heizmann, Michael 1; Beyerer, Jürgen 2
1 Institut für Industrielle Informationstechnik (IIIT), Karlsruher Institut für Technologie (KIT)
2 Karlsruher Institut für Technologie (KIT)


Dynamic Vision Sensors differ from conventional cameras in that only intensity changes of individual pixels are perceived and transmitted as an asynchronous stream instead of an entire frame. The technology promises, among other things, high temporal resolution and low latencies and data rates. While such sensors currently enjoy much scientific attention, there are only little publications on practical applications. One field of application that has hardly been considered so far, yet potentially fits well with the sensor principle due to its special properties, is automatic visual inspection. In this paper, we evaluate current state-of-the-art processing algorithms in this new application domain. We further propose an algorithmic approach for the identification of ideal time windows within an event stream for object classification. For the evaluation of our method, we acquire two novel datasets that contain typical visual inspection scenarios, i.e., the inspection of objects on a conveyor belt and during free fall. The success of our algorithmic extension for data processing is demonstrated on the basis of these new datasets by showing that classification accuracy of current algorithms is highly increased. ... mehr

Verlagsausgabe §
DOI: 10.5445/IR/1000137746
Veröffentlicht am 22.09.2021
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Industrielle Informationstechnik (IIIT)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2021
Sprache Englisch
Identifikator ISSN: 1424-8220
KITopen-ID: 1000137746
Erschienen in Sensors
Verlag MDPI
Band 21
Heft 18
Seiten 6143
Schlagwörter event-based vision; automatic visual inspection; dynamic vision sensors; object classification
Nachgewiesen in Scopus
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