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Determining the required cleanliness level using synthetic test contamination

Brag, P.; Piotter, V.; Plewa, K.; Umbach, S.; Herzfeldt, M.

Abstract (englisch):
As electrification in the automotive industry progresses, the demand is rising for test particles with specific properties. More and more new applications are also being developed, such as processes for validating cleaning steps, contamination tracking or determining cleanliness limits. This article describes how test particles can be reproducibly manufactured in all three dimensions by micro milling. In addition, it explains how the dimensional accuracy of these free-form surfaces can be analyzed with computer tomography.


Verlagsausgabe §
DOI: 10.5445/IR/1000139938
Veröffentlicht am 11.11.2021
Originalveröffentlichung
DOI: 10.1088/1757-899X/1193/1/012072
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Angewandte Materialien - Werkstoffkunde (IAM-WK)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 10.2021
Sprache Deutsch
Identifikator ISSN: 1757-8981, 1757-899X
KITopen-ID: 1000139938
HGF-Programm 43.34.01 (POF IV, LK 01) Lightweight Materials for Structural and Medical Application
Erschienen in IOP conference series / Materials science and engineering
Verlag IOP Publishing
Band 1193
Heft 1
Seiten Artikel-Nr.: 012072
Bemerkung zur Veröffentlichung 9th Manufacturing Engineering Society International Conference (MESIC 2021) 23rd-25th June 2021, Gijόn, Spain
Schlagwörter Technical cleanliness, Synthetic test contamination, Particles, Computer Tomography.
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