Metadata Schemas for FAIR* Data in Materials Science: Scanning Electron Microscopy (SEM) Use Case : A detailed and practical schema developed in cooperation with materials scientists
Joseph, R.
; Chauhan, A.; Eschke, C.; Ihsan A.; Jalali, M.
; Jäntsch, U.; Jung, N.; Kumar, C. N. S.; Kübel, C.
; Lucas, C.; Mail, M.; Mazilkin, A.; Neidiger, C.; Panighel, M.; Sandfeld, S.; Stotzka, R.
; Thelen, R.; Aversa, R.
; Chauhan, A.; Eschke, C.; Ihsan A.; Jalali, M.
; Jäntsch, U.; Jung, N.; Kumar, C. N. S.; Kübel, C.
; Lucas, C.; Mail, M.; Mazilkin, A.; Neidiger, C.; Panighel, M.; Sandfeld, S.; Stotzka, R.
; Thelen, R.; Aversa, R.
| Zugehörige Institution(en) am KIT | Institut für Angewandte Materialien – Angewandte Werkstoffphysik (IAM-AWP) Institut für Biologische und Chemische Systeme (IBCS) Institut für Mikrostrukturtechnik (IMT) Institut für Nanotechnologie (INT) Karlsruhe Nano Micro Facility (KNMF) Scientific Computing Center (SCC) Universität Karlsruhe (TH) – Zentrale Einrichtungen (Zentrale Einrichtungen) |
| Publikationstyp | Poster |
| Publikationsdatum | 04.11.2021 |
| Sprache | Englisch |
| Identifikator | KITopen-ID: 1000140964 |
| HGF-Programm | 31.13.05 (POF IV, LK 01) Neutron-Resistant Structural Materials |
| Weitere HGF-Programme | 46.21.01 (POF IV, LK 01) Domain-Specific Simulation & SDLs and Research Groups |
| Veranstaltung | Research Data Alliance Virtual Plenary 18 (2021), Online, 27.10.2021 – 11.11.2021 |
| Projektinformation | NEP (EU, H2020, 101007417) |
| Bemerkung zur Veröffentlichung | This work has been supported by the Joint Lab "Integrated Model and Data Driven Materials Characterization" (MDMC), the research programs "Engineering Digital Futures" and "Materials System Engineering" of the Helmholtz Association of German Research Centers and the Helmholtz Metadata Collaboration Platform. This project has received funding from the European Union's Horizon 2020 research and innovation programme under grant agreement No. 101007417 within the framework of the NFFA-Europe Pilot (NEP) Joint Activities. |
| Schlagwörter | Metadata Schema, Scanning Electron Microscopy, Materials Science |