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Metadata schema to support FAIR data in scanning electron microscopy

Joseph, R. ORCID iD icon; Chauhan, A.; Eschke, C.; Ihsan, A. Z.; Jalali, M. ORCID iD icon; Jäntsch, U.; Jung, N.; Shyam Kumar, C. N.; Kübel, C. ORCID iD icon; Lucas, C.; Mail, M.; Mazilkin, A.; Neidiger, C.; Panighel, M.; Sandfeld, S.; Stotzka, R. ORCID iD icon; Thelen, R.; Aversa, R. ORCID iD icon


The development and the adoption of metadata schemas and standards are a key aspect in data management. In this paper, we introduce our approach to a metadata model in the field of Materials Science. We present the specific use case of a metadata schema for Scanning Electron Microscopy, a characterization technique which is routinely used in Materials Science. This metadata schema is aiming to be a de-facto standard which will be openly available for reuse and further extension to other electron microscopy techniques.

Verlagsausgabe §
DOI: 10.5445/IR/1000141604
Veröffentlicht am 30.12.2021
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Angewandte Materialien – Angewandte Werkstoffphysik (IAM-AWP)
Institut für Biologische und Chemische Systeme (IBCS)
Institut für Mikrostrukturtechnik (IMT)
Institut für Nanotechnologie (INT)
Karlsruhe Nano Micro Facility (KNMF)
Scientific Computing Center (SCC)
Universität Karlsruhe (TH) – Zentrale Einrichtungen (Zentrale Einrichtungen)
Publikationstyp Proceedingsbeitrag
Publikationsjahr 2021
Sprache Englisch
Identifikator ISSN: 1613-0073
KITopen-ID: 1000141604
HGF-Programm 46.21.01 (POF IV, LK 01) Domain-Specific Simulation & SDLs and Research Groups
Weitere HGF-Programme 46.21.05 (POF IV, LK 01) HMC
46.21.02 (POF IV, LK 01) Cross-Domain ATMLs and Research Groups
Erschienen in Supplementary Proceedings of the XXIII International Conference on Data Analytics and Management in Data Intensive Domains (DAMDID/RCDL 2021): Moscow, Russia, October 26-29, 2021. Ed.: A. Pozanenko
Veranstaltung 23rd International Conference "Data Analytics and Management in Data Intensive Domains" (2021), Moskau, Russland, 26.10.2021 – 29.10.2021
Seiten 265-277
Serie CEUR Workshop Proceedings ; 3036
Schlagwörter Data Management; Metadata schema; Materials Science, Scanning Electron Microscopy; MDMC; HMC; NEP
Nachgewiesen in Scopus
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