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Assessing the optical configuration of a structured light scanner in metrological use

Schild, Leonard 1; Sasse, Fabian ORCID iD icon 1; Kaiser, Jan-Philipp 1; Lanza, Gisela 1
1 Institut für Produktionstechnik (WBK), Karlsruher Institut für Technologie (KIT)


Structured light scanners for three-dimensional surface acquisition (SL scanners) are increasingly used for dimensional metrology. The optical configuration of SL scanners (focal length and baseline distance) influences the triangulation process, on which the scanners' measurement principle relies. So far, only a limited number of studies has investigated the optical configuration's influence on the accuracy of a SL scanner. To close this gap, this work presents a design of experiment in which the optical configuration of a SL scanner is systematically varied and its influence on the accuracy evaluated. Further, tactile reference measurements allow to separate random from systematical errors, while a special test specimen is used in two different configurations to ensure general applicability of the findings. Thus, this work provides support when designing a SL scanner by highlighting which optical configuration maximizes accuracy.

Verlagsausgabe §
DOI: 10.5445/IR/1000147685
Veröffentlicht am 07.06.2022
DOI: 10.1088/1361-6501/ac6e2f
Zitationen: 4
Web of Science
Zitationen: 3
Zitationen: 4
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Produktionstechnik (WBK)
Publikationstyp Zeitschriftenaufsatz
Publikationsdatum 01.08.2022
Sprache Englisch
Identifikator ISSN: 0957-0233, 0022-3735, 0368-4253, 0368-4261, 0950-…0-7671, 1361-6501, 1747-387X, 2051-5677, 2051-5685
KITopen-ID: 1000147685
Erschienen in Measurement Science and Technology
Verlag Institute of Physics Publishing Ltd (IOP Publishing Ltd)
Band 33
Heft 8
Seiten Art.-Nr.: 085018
Vorab online veröffentlicht am 23.05.2022
Nachgewiesen in Web of Science
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