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Time resolved in-situ multi-contrast X-ray imaging of melting in metals

Massimi, Lorenzo ; Clark, Samuel J.; Marussi, Sebastian; Doherty, Adam; Shah, Saurabh M.; Schulz, Joachim ORCID iD icon 1; Marathe, Shashidhara; Rau, Christoph; Endrizzi, Marco; Lee, Peter D.; Olivo, Alessandro
1 Institut für Mikrostrukturtechnik (IMT), Karlsruher Institut für Technologie (KIT)

Abstract:

In this work, the application of a time resolved multi-contrast beam tracking technique to the investigation of the melting and solidification process in metals is presented. The use of such a technique allows retrieval of three contrast channels, transmission, refraction and dark-field, with millisecond time resolution. We investigated different melting conditions to characterize, at a proof-of-concept level, the features visible in each of the contrast channels. We found that the phase contrast channel provides a superior visibility of the density variations, allowing the liquid metal pool to be clearly distinguished. Refraction and dark-field were found to highlight surface roughness formed during solidification. This work demonstrates that the availability of the additional contrast channels provided by multi-contrast X-ray imaging delivers additional information, also when imaging high atomic number specimens with a significant absorption.


Verlagsausgabe §
DOI: 10.5445/IR/1000149199
Veröffentlicht am 29.07.2022
Originalveröffentlichung
DOI: 10.1038/s41598-022-15501-2
Scopus
Zitationen: 2
Web of Science
Zitationen: 1
Dimensions
Zitationen: 3
Cover der Publikation
Zugehörige Institution(en) am KIT Institut für Mikrostrukturtechnik (IMT)
Publikationstyp Zeitschriftenaufsatz
Publikationsmonat/-jahr 12.2022
Sprache Englisch
Identifikator ISSN: 2045-2322
KITopen-ID: 1000149199
HGF-Programm 43.35.01 (POF IV, LK 01) Platform for Correlative, In Situ & Operando Charakterizat.
Erschienen in Scientific Reports
Verlag Nature Research
Band 12
Seiten Art.-Nr.: 12136
Vorab online veröffentlicht am 15.07.2022
Nachgewiesen in Scopus
Dimensions
Web of Science
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