KIT | KIT-Bibliothek | Impressum | Datenschutz

Compared Insights on Machine-Learning Anomaly Detection for Process Control Feature

Wan, Ming; Li, Quanliang; Yao, Jiangyuan ; Song, Yan; Liu, Yang; Wan, Yuxin

Abstract:

Anomaly detection is becoming increasingly significant in industrial cyber security, and different machine-learning algorithms have been generally acknowledged as various effective intrusion detection engines to successfully identify cyber attacks. However, different machine-learning algorithms may exhibit their own detection effects even if they analyze the same feature samples. As a sequence, after developing one feature generation approach, the most effective and applicable detection engines should be desperately selected by comparing distinct properties of each machine-learning algorithm. Based on process control features generated by directed function transition diagrams, this paper introduces five different machine-learning algorithms as alternative detection engines to discuss their matching abilities. Furthermore, this paper not only describes some qualitative properties to compare their advantages and disadvantages, but also gives an in-depth and meticulous research on their detection accuracies and consuming time. In the verified experiments, two attack models and four different attack intensities are defined to facilitate all quantitative comparisons, and the impacts of detection accuracy caused by the feature parameter are also comparatively analyzed. ... mehr


Verlagsausgabe §
DOI: 10.5445/IR/1000151603
Veröffentlicht am 19.10.2022
Originalveröffentlichung
DOI: 10.32604/cmc.2022.030895
Scopus
Zitationen: 5
Web of Science
Zitationen: 4
Dimensions
Zitationen: 5
Cover der Publikation
Zugehörige Institution(en) am KIT Fakultät für Elektrotechnik und Informationstechnik (ETIT)
Publikationstyp Zeitschriftenaufsatz
Publikationsjahr 2022
Sprache Englisch
Identifikator ISSN: 1546-2218, 1546-2226
KITopen-ID: 1000151603
Erschienen in CMC-COMPUTERS MATERIALS & CONTINUA
Verlag Tech Science Press
Band 73
Heft 2
Seiten 4033–4049
Schlagwörter Anomaly detection; machine-learning algorithm; process control feature; qualitative and quantitative comparisons
Nachgewiesen in Scopus
Dimensions
Web of Science
KIT – Die Forschungsuniversität in der Helmholtz-Gemeinschaft
KITopen Landing Page